Light-Cut Method
LJ Series

LJ Series

The position of an object's top surface is detected.
The ability to perform non-contact 2D profile measurements makes it possible to perform step measurement with respect to a reference plane on the target.

Point of selection

  • Possible to measure 2D height within a line
  • Unlimited target selection at ultra-high speeds
  • Ability to output waveform data
LJ-V Series
Ultra-High Speed In-line Profilometer
LJ-V Series