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          3. Microscopes
          4. 3D Laser Scanning Confocal Microscope
          5. 3D Laser Scanning Confocal Microscope
          6. Features

          3D Laser Scanning Confocal Microscope

          VK-X series

          Problems Solved

          Common Problems with Conventional Equipment

          All of these limitations are overcome with a laser scanning microscope

          Optical Microscope

          Optical Microscope

          It is impossible to focus on a target with an uneven surface at high magnification.

          SEM

          SEM

          Observation can only be performed in black and white, sample size is limited and pre-processing is time consuming.

          Roughness Gauge

          Roughness Gauge

          Projections and depressions cannot be measured without damaging the target area.

          All of these limitations are overcome with a laser scanning microscope

          Optical Microscope

          Poor Resolution, Low Contrast

          Poor Resolution, Low Contrast

          Disc pits (6000x)

          Shallow Depth-of-field

          Shallow Depth-of-field

          Blade edge (1000x)

          No Support for Traceability

          No Support for Traceability

          High-resolution, Large Depth-of-field Observation

          High Resolution, 24000x Magnification

          High Resolution, 24000x Magnification

          Disc pits (6000x)

          Fully-focused Image

          Fully-focused Image

          Blade edge (1000x)

          Traceability Compatible

          Traceability Compatible

          Measurement results obtained using the VK Series are highly reliable and comply with national traceability standards.

          SEM

          Monochrome Image Only

          Monochrome Image Only

          Ink toner (1000x)

          Time-consuming Preparation and Observation

          Time-consuming Preparation and Observation

          Restricted Sample Size

          Restricted Sample Size

          Observation may not be possible due to the size of the sample because it cannot fit in the sample chamber.

          Rapid 3D Colour Imaging

          High-definition Colour Image

          High-definition Colour Image

          Ink toner (1000×)

          No Sample Preparation

          No Sample Preparation

          Measure Samples of any Size and Nearly any Material

          Measure Samples of any Size and Nearly any Material

          Detachable head unit allows for a variety of sample sizes to be measured, can be integrated with other devices and supports remote operation.

          Roughness Gauge

          Sample Scratched due to Contact with Probe

          Sample Scratched due to Contact with Probe

          Aluminium surface (200x)
          Horizontal indentations on screen.

          Difficult to Measure Target Areas

          Difficult to Measure Target Areas

          Hitting the desired area of a target with a stylus can be problematic for targets like screw thread crests.

          Resolution is Limited by Stylus Tip Diameter

          Resolution is Limited by Stylus Tip Diameter

          It is not possible to measure surfaces that are smaller than the tip of the roughness gauge's stylus.

          Non-destructive Profile and Roughness Measurements

          Microscope Library

          Microscopes