Next-generation optical microscope with a large depth-of-field and advanced measurement capabilities for inspection and failure analysis.
Non-contact 3D metrology system performs nanometer level profile, roughness and thickness measurements on nearly any material.
High-precision, non-contact area profiler captures accurate and repeatable 3D measurements over a large area in just seconds.
High-speed motion recording enable accurate filming of high-speed motion that conventional microscopes cannot capture.
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