A New Era of High Resolution Inspection

NEW Ultra-High Resolution Cameras CV-X/XG-X Series

INSTANT MEASUREMENT

NEW Image Dimension Measurement System IM-8000 Series

Now equipped with white light interferometry, measure from nanometres to millimetres

3D Laser Scanning Microscope VK-X3000 Series

3200 Points/Profile

High-Resolution Inline Measurement

NEW 2D/3D Laser Profiler LJ-X8000 Series

Automatic Focus and Position Correction

NEW 3-Axis Hybrid Laser Marker MD-X Series