3D Measurement Systems

Off-line 3D measurement systems for various industries and applications.


VL-700 series - 3D Scanner CMM

The VL-700 Series 3D Scanner CMM is equipped with the world’s first fully automatic CAD conversion function. From scanning to STEP file output, this scanner handles everything automatically. There is no need to go through specialised conversion software to obtain data in a format accessible by CAD software, which eliminates these steps from the work procedure. Furthermore, the newly developed high-resolution transmitter and receiver lenses and WDR (Wide Dynamic Range) CMOS sensor offer twice the detection ability of conventional models. True-to-life scanning makes it possible to obtain accurate 3D data with shape and colour information. Using the comparison fitting algorithm, CAD data and coordinates can be used to perform comparative measurements.

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VR-6000 series - 3D Optical Profilometer

The VR-6000 optical profilometer performs non-contact measurement to replace stylus profilometers and roughness meters. This 3D profile system captures full surface data across the target with a resolution of 0.1 µm, enabling measurement of features that cannot be performed with probe-type instruments. The new rotational scanning greatly expands the measurement capabilities of the system. True-to-life cross section measurements can be performed with no blind spots. Wall thicknesses and recessed features can be measured without cutting or destroying the target. In addition, the HDR scanning algorithm provides enhanced scanning capabilities for instantly determining the optimal settings to capture high quality data, even on glossy and matte surfaces.

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VK-X3000 series - 3D Laser Scanning Microscope

The VK-X3000 Series uses a triple scan approach to enable measurement of any target. White light interferometry, focus variation, and laser confocal scanning methods are used depending on the situation, ensuring high-accuracy measurement and analysis of any target. The triple scan approach offers unprecedented adaptability, allowing the system to achieve 0.01 nm resolution to identify the smallest surface irregularities on flat targets, while also offering the flexibility to measure targets with large height changes across areas as large as 50 x 50 mm. With its ability to perform high-magnification colour imaging, non-destructive cross-section measurements, and advanced surface characterization, the VK-X3000 3D Surface Profiler is the go-to-system for R & D and quality labs.

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