can perform non-contact profile, roughness, and film thickness
measurements with nanometer-level resolution on any material or
By combining white light with a
laser light source, LSCMs are able to scan a surface and collect
both an optical image and high-resolution surface data.
Nanometer-level heights can be measured by analyzing the intensity
of the returned laser light relative to the z-position of the
measurement systems, such as contact profilers and interferometers
can damage the material being measured or are unable to provide
data on certain materials and surfaces. These devices can also be
costly, time-consuming to operate, and difficult to use.
Simply place your
sample on the stage, click measure, and the VK-X250 will
automatically scan and measure your sample. Our advanced analysis
software will automatically analyze the data and recommend key
roughness parameters to evaluate.
No Restrictions on
Automatically Compare and Analyze Multiple
Accurate Measurements Over a Wide Area
KEYENCE has been an industry leader in sensing technology
since 1974. KEYENCE's direct sales team visits customers with live
demo equipment to find the best possible solution for all
Learn more about the VK Series 3D Laser
Non-contact Profile and Roughness Measurements on Nearly Any Material.
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