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Laser Scanning Microscope VK-X3000
Laser microscopes can perform non-contact profile, roughness, and film thickness measurements over an area with nanometer-level resolution on any material or shape.
The VK-X3000 does not only calculate line roughness ( ISO 4287) but also surface roughness ( ISO 25178). The VK-X3000 uses a unique function that automatically compares multiple parts based on 47 roughness parameters. Roughness measurements are possible from several microns up to as small as a few nanometers.
By combining white light with a laser light source, laser scanning confocal microscopes are able to scan a surface and collect both an optical image and high-resolution surface data. Nanometer-level heights can be measured by analyzing the intensity of the returned laser light relative to the z-position of the laser.
Simply place your sample on the stage, click measure, and the VK-X3000 will automatically scan and measure your sample. Our advanced analysis software will automatically analyze the data and recommend key roughness parameters to evaluate.
Steep Angle Measuring
Multiple roughness measurement and surface analysis
High-resolution Color Imaging
Possibility of measuring up to 42 Different Roughness Parameters
KEYENCE has been an industry leader in sensing and measurement technologies since 1974. KEYENCE's direct sales team consults with customers and provides on-site demonstrations of equipment to find the best possible solution for any application.
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