A single device for measurement, observation and quality control for all industries and academic research
- Large depth of field and high resolution
- 0.1 to 6000× magnification, bright field, dark field, transmitted light, DIC, and polarised illumination
- Observation of low-contrast and highly-reflective samples
- Advanced 2D/3D measurement tools including grain analysis and contamination analysis
- Elemental analysis, observe and instantly identify materials
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