Uiterst nauwkeurig optisch meetsysteem

LM Reeks

Catalogi Catalogus Downloaden

Uiterst nauwkeurig optisch meetsysteem LM Reeks

LM Reeks - Uiterst nauwkeurig optisch meetsysteem

A high-precision, optical gauge that allows operators to achieve dimensional measurement results to +/-0.1um. Utilising automatic focus, epi-illumination, and high precision optics, at the push of a button you can repeatably measure all 2D features, including height.