Profilometer / Roughness
Capturing the features of the target as a surface enables instant measurement of 3D figures over a wide area. This non-contact roughness meter / profile measurement system can measure surface roughness as well as burrs and other microscopic shapes in as little as 1 second. The system automatically determines settings such as the sensitivity according to the target height, size, material, and colour. It eliminates measurement mistakes, saves time, and allows inexperienced users to start capturing data immediately.
Products Lineup
The VR-6000 optical profilometer performs non-contact measurement to replace stylus profilometers and roughness meters. This 3D profile system captures full surface data across the target with a resolution of 0.1 µm, enabling measurement of features that cannot be performed with probe-type instruments. The new rotational scanning greatly expands the measurement capabilities of the system. True-to-life cross section measurements can be performed with no blind spots. Wall thicknesses and recessed features can be measured without cutting or destroying the target. In addition, the HDR scanning algorithm provides enhanced scanning capabilities for instantly determining the optimal settings to capture high quality data, even on glossy and matte surfaces.
Features
Rotational Scanning on a Wide Variety of Materials
A 3D profilometer can be used for a wide range of applications across multiple industries. Examples of materials that can be analysed using a surface profiler include medical devices, jet engine turbine vanes for the aerospace sector, and valve trains found in automotive manufacturing. Using a 3D surface profilometer in these contexts means you can get accurate measurements of material thickness and detection of defects without the need for the instrument to come into contact with the object. Unlike conventional surface roughness profilometers, parts can be rotated to scan surfaces that would not be accessible otherwise. These qualities and capabilities make these devices ideal for collecting measurements and inspecting precision components such as batteries, circuit boards, and stamped metal parts.
HDR Scanning Algorithm Enables Measurement of More Materials
Automatic Rotation to Perform Measurements with No Blind Spots
Measure Nearly Any Callout with a Single Device
There are numerous measurements that can be taken with a 3D profilometer. For example, this system can be used to record the profile of a target by tracing its surface, enabling measurement of 3D features and surface roughness. It can also capture 2D data to measure lengths, widths, and angles. A 3D profilometer also creates a computer-generated 3D model of the object for visualisation of the overall shape, while still maintaining a high resolution to observe minute surface features.
Capture Full Surface Data with 0.1 µm Resolution in Just 1 Second
Consolidate Multiple Measurement Systems Into One Device
The VK-X4000 Series 3D Laser Scanning Microscope combines laser confocal, white light interferometry, and focus variation methods into a single metrology system, enabling highly accurate, non-contact measurements on nearly any material and surface geometry. Its newly-developed multi-point measurement function further streamlines the analysis process by automating measurements across multiple locations and samples—eliminating complex setup or programming while delivering greater usability, throughput, and repeatability.
Features
Three Measurement Principles in One System: Unmatched 3D Precision for Any Surface, Any Material, Any Geometry
Laser Confocal
Measure any material, any shape.
White Light Interferometry
Accurately capture 3D surface data with sub-nanometre resolution.
Focus Variation
Measure fine surface detail over a large area.
Multi-Point Scan for Easy & Automated 3D Measurements
Multi-Point Measurement
Easily configure position, coordinates, and magnification settings simply by clicking the point to be measured.
Automatic Measurement of Multiple Features
Target features on a part can be easily selected. All measurement conditions are automatically applied.